Fault Analysis For Low Power Search Mask Ternary Content Addressable Memory Using Built In Self Test For Reliability Enhancement

  • S.Murugeswaran, A.Latha, Dr. G.Yamuna
Keywords: Ternary Content Addressable Memory, TCAM, Memory BIST, Built in Self-Test, March Algorithm, Reliability, Low Power, Fault Analysis.

Abstract

As the technology downscale towards minimal nodes, Reliability is becoming the critical issue to be concentrated in building a quality integrated chips. Memory circuits play the key role in most of the applications. This paper aims at improvising the reliability by doing fault analysis for Ternary Content Addressable Memory (TCAM). These are distinctive memory type in which the address of a specific data can be retrieved from the stored location. This is the unique memory that also performs compare operation apart from the regular read and write operations. The compare operation is performed in serial fashion and these additional operations also leads to higher power consumption when compared to other memories. Hence, another objective of this paper also focus on reducing the power consumption by the proposed Search Mask TCAM (SM-TCAM) circuit.  This is achieved by optimizing the search operation by introducing the mask bit value. With the help of this mask bit, during search, the data is compared with mask values and the matching data’s corresponding address can be read out easily than the conventional serial search fashion. Also to test and diagnose the fault in proposed design, Built-In-Self-Test (BIST) logic is implemented. The algorithm used for designing BIST logic is March Algorithm which has specific patterns for read and write operations and separate logic to detect the fault in memory shows better performance in terms of Power, Area and PDP. This proposed logic can be implemented for many applications like ATM’s, laptops, mobiles and all other memory operated devices.

Published
2021-09-28
How to Cite
Dr. G.Yamuna, S. A. (2021). Fault Analysis For Low Power Search Mask Ternary Content Addressable Memory Using Built In Self Test For Reliability Enhancement. Design Engineering, 14853-14866. Retrieved from http://www.thedesignengineering.com/index.php/DE/article/view/4772
Section
Articles